ECE EDS Seminar: Gianluca Fabi: Innovative Microwave Microscopy Techniques


Virtual Event


EDS Seminar

Innovative Microwave Microscopy Techniques for Quantitative Measurement and Electromagnetic Characterization

Gianluca Fabi
Università Politecnica delle Marche (Ancona, Italy)


The Near-field Scanning Microwave Microscopy (NFSMM or simply SMM) employs the microwave near-field interaction between a probe (source) and a sample to image and characterize materials with atomic resolution. The microscope measures the local properties of the sample by collecting the response signal originated from this interaction, and the probe dimension mainly determines the resolution rather than the excitation wavelength. The usage of microwave frequencies is advantageous due to the relatively low energy of microwave radiation that allows low-invasive and nondestructive measurements. Moreover, the SMM senses not only surface structures, but also electromagnetic properties up to a few micrometers below the sample surface due to the microwave penetration. In this context, the seminar presents recent advances for the quantitative characterization of samples by SMM, an innovative SMM structure that enhances the microscope performance, and new methodologies to remove parasitic and unwanted effects in captured data. We will explore the electromagnetic characterization of a wide variety of samples and surfaces by this tool, ranging from materials for electronic applications, such as low-dimensional or ferroelectric materials, up to biological structures like live cells and sub-cellular elements.


Gianluca Fabi received his B.S. degree in 2015 from Università Politecnica delle Marche, Ancona, Italy, and his M.S. degree in 2017 from Politecnico di Torino, Torino, Italy, both in Electronics Engineering. Since 2017 he is a Ph.D. student at the Department of Information Engineering of Marche Polytechnic University, Ancona, Italy. His current research focuses on the investigation of local electrical properties of soft and hard matter using scanning microwave microscopy techniques. His recent studies are mainly focused on the high-frequency characterization of biological samples and solid materials for electronic applications.